Dielectric constant(Permittivity, εr') , dielectric loss tangent(tanδ), permeability(μr') measurement system

How to select the measurement methods of dielectric constant, dielectric loss tangent

Only typical cases are guided in the following table.
Please feel free to contact us regarding other specimens.

Selection 1　　Judge from specimens

Only typical cases are guided in the following table. Please feel free to contact us regarding other specimens.
Ο　:　Optimum
Δ　:　Available

Model number

(01)

(02)

(03)

(04)

(05)

(06)

(07)

(08)

(09)

(10)

(12)

(13)

(14)

(15)

(16)

(17)

Specimen type

Multilayer material

Δ

Ο

Ο

Printed board

Ο

Ο

Ο

Ο

Film(Ultra thin film)

Ο

Ο

Powder

Ο

Ο

Ο

Δ

Sheet(Board)

Ο

Ο

Ο

Ο

Δ

Ο

Ο

Ο

Phantom material

Ο

Ο

Wave absorber

Ο

Δ

Ο

Ο

Ο

Noise suppression sheet

Ο

Δ

Ο

Ο

Soil

Ο

Δ

Ο

Δ

Ο

Concrete, Asphalt

Δ

Ο

Ο

Ο

Δ

Fruit, Vegetable

Ο

Ο

Ο

Liquid

Ο

Ο

Ο

Δ

Radome cover

Ο

Ο

Ο

Ο

Ceramics

Ο

Ο

Ο

Ο

Δ

Δ

Ο

Dielectric resonator

Ο

Ο

Ferroelectric

Δ

Ο

Δ

Dielectric constant measurement system

Model number (measurement method)	The type of measurement	Measurement frequency	Feature
(01)	Open resonator method	18GHz-110GHz	Accuracy is high. Frequency of point phase measurement is unnecessary.
(02)	Resonance method strip line type	800MHz-14GHz
(03)	Resonance method micro strip line type	800MHz-14GHz
(04)	Perturbation method	200MHz-20GHz
(05)	(Propagation delay mode cut back type) Coaxial tube method	45MHz-40GHz	Accuracy is low. Frequency sweep The bias can be impressed.
(06)	(") Free space method
(07)	(") Coplanar line method
(08)	(") Stripline method
(09)	Probe method(open mode)	200MHz-90GHz
(10)	Angle of incidence change method	2.6GHz-110GHz	Accuracy is low.
(12)	Capacitance method	100Hz-100MHz	Low frequency
(13)	(S-parameter method) Reflection and transmission mode	12MHz-40GHz	Large loss material, just fit. measurement of dielectric cnstant, permeability.
(14)	(") Reflection mode for flat plate
(15)	(") Transmission mode for flat plate
(16)	Parallel conductor plate type dielectric resonator method	3GHz-26.5GHz	Accuracy is high. Frequency of point phase measurement is unnecessary.
(17)	Eripsometore method	26.5-110GHz	phase measurement is unnecessary. measurement of dielectric cnstant, permeability.

Selection by measurement frequency, dielectric constant, dielectric loss tangent

Selection by measurement frequency, dielectric constant, dielectric loss tangent

Selection by measurement frequency, method, specimen size

Selection by measurement frequency, method, specimen size

Selection by the demand

Only when it is typical, it describes. Please inquire about others or details.

When you want to measure an ultra thin film on the printed board in high accuracy. (measurement of film, multilayer material)	»	Perturbation method
When you want to measure the film that cannot exist in the unit in high accuracy. (measurement of film, multilayer material)	»	Perturbation method
When you want to measure it by high accuracy.(εr' ±1% tanδ ±3%)	»	Perturbation method
There is only a small sample of about 1mm.	»	Probe method
When you want to measure it in high accuracy by super-high frequency. (20GHz - 110GHz)	»	Resonance method resonator open type
When you want to measure it by super-low frequency.(10μHz - 10Hz)	»	Capacitance method
When you want to measure the liquid.	»	Probe method
When you want to measure the powde.	»	Probe method
When you want to measure the volatile matter such as gasoline.	»	Probe method
When you want to measure it while changing the temperature.	»	Capacitance method
Anyway, when you want to change the frequency, and want to roughly measure it by low accuracy.(εr' ± 7% tanδ ± 10%)	»	S-parameter method
When it is not possible to cut it, because the sample is large. Or, when you do not want to cut it.(Non-destructive)	»	Resonance method micro strip line type
Anyway, when you want to measure it easily.	»	Probe method
When you want to measure dielectric constant, dielectric loss tangent,and permeability.	»	S-parameter method

Features of KEYCOM's measurement systems and measurement technologies

Features of KEYCOM's measurement systems and measurement technologies

* We can propose the most suitable measurement techniques and instruments through abundant experiences accumulated in our measurement services.
* We can quickly respond the customization and technical requirements of customers.
* CEO, Hirosuke Suzuki, participates in a committee preparing the standardization proposal to IEC(International Electrotechnical Commission).
* The measurement systems, for dielectric constant and dielectric loss tangent and for permeability, which KEYCOM has developed were accepted as the standard of JIS(Japanese Industrial standard). The electromagnetic-absorption-ratio measurement system is schedule to be accepted as the standard also of IEC in 2007.

On the measurement systems of dielectric constant and permeability

* We can propose useful measurement technologies for various specimens of almost all forms as such solid, sheet, film, powder, liquid(oil), multi-layered: Customization of the system is carried out through abundant experiences of a lot of measurements and developments of components, cables and so on.
* We can supply the measurement system in the 10μHz~110GHz frequency range.
* In the microwave frequency range, the measurements in accuracy of ±1%(εr) and the ±3%(tan δ) are possible.
* In the millimeter wave frequency range, the measurements in accuracy of ±3%(εr) and the ±7%(tan δ) are possible.
* KEYCOM participates in a standardization committee of JIS.
* We can quickly respond the customization and technical requirements of customers.

Contents

Resonance method(JIS enacted open-type resonance method JIS R 1660-2) CEO, Hirosuke Suzuki, participated in the standardization committee for the open resonator method(JIS R 1660-2:2004) which was held in the spring of 2004.

Open resonator method for sheet and ultra thin sheet dielectric constant and dielectric loss tangent(millimeterwave) measurement system

dps03002990714-18

This system can measure εr and tan δ of ultra-thin films. It employs a Fabry-Perot resonator having an open resonator allowing it to achieve a high measurement accuracy in the millimeter-wave frequency range and also ensuring easy access to the specimen hold plate. In addition, it has the advantage that it can measure specimens having a low tan δ. Measurements are automatically controlled using PC having a with Windows operating system. These features were presented at the 2005 IEEE Instrumentation and Measurement Technology Conference. This method was adopted as a JIS standard(JIS R 1660-2:2004) in 2004.

* high accuracy : εr' ± 3% , tan δ ± 7% * ultra-thin films having thicknesses of 10 - 100 mm can be measured. * simple to operate * measurement range: 18 GHz - 110 GHz

Resonance method strip line type for sheet dielectric constant and dielectric loss tangent measurement system

dps50002070405-07

In frequency range from 800MHz to 14GHz, it is the measurement system of εr'and tanδ , for sheet material of small dielectric loss tangent and 1-40 εr'. We follow the ASTMD3380-75 Standard method of Test for Permittivity(Dielectric Constant) and Dissipation Factor of Plastic-Based Microwave Circuit Substrates and IPC-L-125 Specification for Plastic Substrates, Clad or Unclad, for High Speed / High Frequency Interconnections.

Resonance method micro strip line type for sheet and ultra thin sheet dielectric constant and dielectric loss tangent measurement system

dps01002000313-08

This is a measurement equipment and system which measures εr and tanδ of the material that the dielectric substance loss is comparatively small, and εr is roughly 1 from 40 in the frequency being from 800MHz to 14GHz. It is a measurement kit that conforms to ASTMD3380-75 Standard method of Test for Dielectric Constant and Dissipation Factor of Plastic-Based Microwave Circuit Substrates, IPC-L-125 Specification for Plastic Substrates, Clad or Unclad, and for High Speed/High Frequency Interconnections and it can measure εr and tanδof the ultra thin dielectric substance sheet.

Perturbation method

Perturbation method specimen-hole closed type, cavity resonance mode, for ultra thin sheet dielectric constant and dielectric loss tangent measurement system

dps18002031022-11

This is a high precision perturbation measurement instrument that measures a specimen's dielectric constant(εr') and dielectric loss tangent(tan δ) in the microwave region. In accordance with the method prescribed by JIS standards(JISC2565 in 1992), "KEYCOM" has improved measurement accuracy by closing the hole into which the specimen is inserted with metal. Furthermore, an updated model having high measurement accuracy has been available since January, 2005. * high accuracy : εr', ± 1% and tan δ, ± 3% * ultra-thin films having thicknesses down to 0.1 μm can be measured. * layered films can be measured * The solid, seat film, powdered material, liquid(Oil etc.), and mutilayered can be measured. * simple to operate * measurement range: 200 MHz - 20 GHz

Propagation delay method

Propagation delay mode cut back type coaxial tube method dielectric constant and dielectric loss tangent measurement system

dps05002981027-10

In the 45 MHz-40 GHz frequency range, this system measures permittivity(dielectric constant, εr) and dielectric loss tangent(tan δ) of liquids having εr of approximate 1.05-500. It can also estimate the voltage dependence of εr and tan δ for samples such as liquid crystals by applying a bias voltage during the measurement.

Propagation delay mode cut back type Free space method dielectric constant and dielectric loss tangent measurement system

dps06002000831-05

In the 45 MHz-40 GHz frequency range, this system measures dielectric constant/permittivity and dielectric loss tangent of the materials which have dielectric constant of approximate 1.05-500. Especially it greatly contributes to large loss specimens

Propagation delay mode Cut Back type Coplanar line method dielectric constant and dielectric loss tangent measurement system

dps07002010619-24

This system measures the permittivity(dielectric constant, εr) and the dielectric loss tangent(tan δ) of liquids and powdered materials in the 500 MHz - 65 GHz frequency range. In liquid measurement, a sample covers a coplanar line to a thickness of approximately 0.2 mm. The εr and tan δ values of the liquid sample are then calculated from the actual εr and tan δ values of the dielectric complex consisting of the liquid and the coplanar line, using installed simulation software that simulates the electromagnetic field of a coplanar line. In addition, the voltage dependence of εr and tan δ for samples such as liquid crystals can be estimated by applying a bias voltage during the measurement.

Propagation delay mode Cut Back type Stripline method dielectric constant and dielectric loss tangent measurement system

dps15

In the 45 MHz-40 GHz frequency range, this system measures permittivity(dielectric constant, εr) and dielectric loss tangent(tan δ) of dielectric substance sheets and clayey materials, etc.For the measurement of powdered materials, we can provide an optional software which calculates the true εr and tan δ using a bulk specific gravity and a absolute specific gravity, and can also do a temperature measurement equipment and a calculation software of temperature dependency. The voltage dependence of εr and tan δ can be estimated by applying a bias voltage during the measurement.

Probe method

Open mode probe method dielectric constant and dielectric loss tangent measurement system

dps16002021001-11

* Measurement frequency can be select in a wide range, 200 MHz - 90GHz. * Solid, liquid, and powdered materials can be measured. * Standard specimen other than pure water can be available(ex. acetone and ethanol). * simple to operate Features of KEYCOM probe method *Standard specimen other than pure water can be available Acetone can be used as a standard specimen for the correction other than pure water. . The dielectric properties of acetone have been well studied. Moreover, acetone solution scarcely change in a storage because of little absorption of moisture in air and has different dielectric properties from pure water. *A lot of kinds of probes are aviialable. Its probe's outside diameter has a variation of 1.2 mmΦ, 2.2mmΦ, 3.6mmΦ, and 6.6mmΦ, and it is effective the powdered specimein. A big probe of the outside diameter is used when the particle shape is large. *The range of the frequency is wide. In general, the upper bound frequency of the probe method used is 50GHz. However, KEYCOM's method can use it for 90GHz.

Angle of incidence change method

Angle of incidence change method dielectoric constant, dielectric loss tangent, permeability measurement system

dps22002040516-08

This system can measure the dependency on angle of incidence of the magnitude and phase of the reflection coefficient in both the TE wave and the TM wave. Complex relative permittivity and complex permeability are estimated from these measured values. Unlike the coaxial-tube-type or a waveguide-type methods, this method does not involve errors caused by air-gaps since the specimens are not installed in a fixture. Moreover, the lens attached to antenna enables to measure samples with plane wave, resulting in the high measurement accuracy. In addition, this method using a parallel beam from a antenna can reduce the size of a specimen. In all frequency range,. εr and μr can be obtained.

Capacitance method

Capacitance method, flat plate, liquid, gel, ultra thin film, compound film, dielectric constant and dielectric loss tangent measurement system

dps17002040705-04

It is a system that measures the dielectric constant and dielectric loss tangent, factor of a flat plate, the liquid, and the gel. (It is possible to correspond from the room temperature to 200 degree.) When we measure a ultra thin film, a film on the semiconductor wafer and a film, we use electrode DPT-009 for measurement and an assistant for electrodes. It has the interface that controls the external with CPU.

S parameter method

S-parameter method, reflection and transmission mode, coaxial tube and waveguide type dielectric constant, dielectric loss tangent, permeability, measurement system

dps08002011118-07

This measurement equipment enables 2 different kinds of measurement methods of the reflection and the transmission, one of which can be chosen depending on the purposes. Either method makes it possible to measure complex dielectric constant and complex ur at the same time. How to select one of the 2 methods is as follows. Also an absorption ratio and a reflection ratio of the electromagnetic absorber can be obtained by calculating complex dielectric constant and complex μr.

S-parameter method　Free space type reflection mode for flat plate dielectric constant and permeability measurement system

dps09002981027-08

Unlike the coaxial-tube-type or a waveguide-type methods, this method does not involve errors caused by air-gaps since the specimens are not installed in a fixture. Practical data can be obtained even when the specimen is placed on a rough, uneven surface. It is compact and allows specimens to be measured by flat-wave because of the direct installment of lens with an antenna. It performs measurements by monitoring the S11 parameter via connections of a test fixture to a vector network analyzer and PC.

S-parameter method　Free space type transmission mode for flat plate dielectric constant and permeability measurement system

dps21002040614-08

Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap because specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on. It enables compactness and measuring specimens by flat-wave because of direct installment of lens with an antenna. Measurement is achieved by monitoring S21 & S11 parameter with connections of a test fixture to a vector network analyzer and PC.

Others

Parallel conductor plate type dielectric resonator method dielectric constant and dielectric loss tangent measurement system

dps14002021001-11

This is a highly accurate measurement equipment mainly measures εr and tanδ in the micro wave band of the low loss material. It uses a columnar shape specimen. Moreover, this is a measuring method provided in JIS standard as JIS R 1627.

Eripsometore method, dielectric constant and permeability measurement system

dps02002051012-05

Because it is a scalar measurement, an expensive vector network analyzer is not required. Moreover, dielectric constant compared with source and permeability compared with source can be requested by measuring the difference between TE TM wave of the reflection coefficient and amplitude ratio of the wave and phase. It is unlike coaxial tube or waveguide, and the error by the airgap doesn't occur because it doesn't put the sample in Ficscha. In addition, it is compact size because it installs a lens to an antenna. However, you can measure a sample by plane wave. And, the sample can be reduced, because the sample can be set in the antenna neighborhood. And, you understand εr' and μr every frequency