KEYCOM provides solutions in the 300 GHz to 1 μHz frequency range (SHF/EHF/MW/UHF/VHF/ULF).
We undertake designing, manufacturing and measuring. Please feel free to contact us.

About KEYCOM

Catalog No.

Corporate Profile

Name KEYCOM Corporation
Headquarters 3-40-2 Minamiotsuka, Toshima-ku Tokyo 170-0005, Japan
Tel: +81-3-5950-3101
FAX: +81-3-5950-3380
Home Page: http//www.keycom.co.jp/ E-mail:info@keycom.co.jp
Established September 24, 1992
CEO Hirosuke Suzuki
Bank Bank of Mitsuisumitomo Bank
account Tokyomitsubishi Bank Otsuka Branch

Major customers (World)

NEC(Japan), TOSHIBA(Japan), HITACHI(Japan), Canon(Japan), TOYOTA(Japan), HONDA(Japan), NTT(Japan), NTT Docomo(Japan), FUJITSU(Japan), Yale University(USA), Stanford University(USA), MIT(Massachusetts Institute of Technology)(USA), Los Alamos National Laboratory(USA), Felmi lab(USA), Jet Propulsion Laboratry(USA), Laboratory for Physical Sciences(USA), Institute of Physics University of Basel(Switzerland), Swiss Federal Office of Metology and Accreditation(Swizerland), Helsinki University of Technology(Finland), Physikalisch-Technische Bundesanstalt(Germany), Technical University Delft (The Netherlands), The university of New south wales(Australia), School of Physics(Australia), National Taiwan University(Taiwan), Hyun-kyo Shin(Korea), etc.

Awards, certificates of appreciation, etc.

1993 Received Dupont Plunkett Awards
For invention of millimeterwave dielectric material waveguide.

1999 Received a certificate of appreciation from High Energy Accelerator Research Organization
For contributions to construct B Factory test facilities and Long Baseline Neutrino Oscillation test facilities.

2000 Received a certificate of appreciation from National Astronomical Observatory
For development of 100 GHz multi-beam observation system installed at Nobeyama Radio Observatory Cosmic Radio Facilities.

2002 Received a certificate of appreciation from High Energy Accelerator Research Organization
For contribution to achieve the world best performance by maintaining B Factory test facilities and by improving its performance.