Keycom service center for quality measurements, evaluation and analysis

Catalog No. es

Based on an accumulation of experience with measurements and development of measurement devices since the company was founded in 1992.
Keycom offers precise measurement methods and devices, making it possible to obtain accurate values quickly.

Keycom also owns various measurement devices, such as 70GHz vector network analyzers, 110GHz scalar network analyzers, 110GHz spectrum analyzers, and 70GHz oscilloscopes.

Our services are suitable when:
- You need only a small number of measurements
- You need accurate measurement results
- You are in a hurry
- You are not in a position to buy the measurement equipment yourself

Measurement service

Electric material constant, electric material characteristic measurement and analysis system

*Dielectric constant (permittivity, εr') and dielecric loss tangent (tan δ)
*Electric wave absorption rate
*Magnetic property characteristic
*Transmission attenuation
*Shield Effect
*ESR(Electro spin resonance) mesurement
*Migration
etc.

Antenna

*Antenna radiation characteristic
*Transmission characteristics

*Antenna pattern profile
*Gain

Measurement Services Provided by Keycom

*	Our rich experience in providing measurement services enables us here at Keycom to offer precise measurement methods and equipment that makes it possible to obtain accurate values quickly. → Usual delivery period: 1 week (negotiable if express delivery is required) → Delivery at the end of the year or other busy periods: 2 weeks (negotiable if express delivery is required) → Delivery in the case of time-consuming measurements: 2~3 weeks (negotiable if express delivery is required)

*	Even in the case of measurements that require complex technology or that are not available at the current time, if such measurements are theoretically possible, Keycom will do its best to realize them by utilizing our experience developing various measurement devices. Please call us for a consultation (note that the delivery period is longer than usual, at 3 weeks or more). Example: Measurement method developed in November 2005→ measurement of the electric permittivity and the dielectric tangent for ultrathin films (0.01μm) with low-frequency waves.

*	CEO of Keycom is a full member of the International Electrotechnical Commission (IEC) for the development of standards

*	Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS). →Elected for JIS standardization by committee members -Measurement of electrical permittivity -Measurement of rate of absorbance of radio waves

*	Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS). →Methods for measuring the dielectric characteristics of fine ceramics in the millimeter-wave region Part2:Open resonator method -JIS R 1660-2:2004- →Noise Suppression Sheet for digital devices and equipment　 Part2:Definitions and general Properties -IEC62333-1:2006-05- Part3:Measuring method-IEC62333-2:2006-05- →Methods for measuring the rate of absorption of radio waves for wave absorbers in the millimeter-wave region　-JIS R 1679:2007- →Measurement Methods for Reflectivity of Electromagnetic Wave Absorbers in Millimeter Wave Frequency -IEC62431-