|A. Electric material properties / characteristics electromagnetic wave / electrical characterization and measurement||B. Antenna, Radar||C. Circuit evaluation, board analysis, product / defect / failure analysis|
|1. Dielectric constant (permittivity, εr') and dielecric loss tangent (tan δ)||1. Antenna radiation, Antenna pattern profile, Gain||1. Substrate analysis|
|2. Reflection / absorption characteristics / radio wave absorption rate (wave absorber, anti-reflective material, stealth paint) of the radio control material (far field / near-field noise suppression sheet)||2. Evaluation and measurement of millimeter-wave radar|
|3. Magnetic material (magnetic permeability, etc.)||3. Measurement of the beam shift and the transmission attenuation by emblem or bumper|
|4. Transmission attenuation||4. Simulation of RCS (Radar Cross Section)|
|5. Shield Effect||5. Acquisition of image data and the RCS of the object|
|6. EPR(Electro spin resonance) mesurement||etc.|
|7. Transmission characteristics|
|9. Conductivity / electrical conductivity / volume resistivity measurement|
|10. Transmission / reflection characteristic measuring (Impedance evaluation, Q value evaluation)|
|11. Load Q-value (QL) measurement, material Q-value (Q0) is estimated|
|12. Conductivity measurement, The surface resistance measurement|
|13. Contact probing in the millimeter-wave band|
|D. Simulation||F. Consultant etc.|
|1. Molecular orbital calculation||1.|
Measurement Services Provided by Keycom
|*||Our rich experience in providing measurement services enables us here at Keycom to offer precise measurement methods and equipment that makes it possible to obtain accurate values quickly.
→ Usual delivery period: 1 week (negotiable if express delivery is required)
→ Delivery at the end of the year or other busy periods: 2 weeks (negotiable if express delivery is required)
→ Delivery in the case of time-consuming measurements: 2~3 weeks (negotiable if express delivery is required)
|*||Even in the case of measurements that require complex technology or that are not available at the current time, if such measurements are theoretically possible, Keycom will do its best to realize them by utilizing our experience developing various measurement devices. Please call us for a consultation (note that the delivery period is longer than usual, at 3 weeks or more).
Example: Measurement method developed in November 2005→ measurement of the electric permittivity and the dielectric tangent for ultrathin films (0.01μm) with low-frequency waves.
|*||CEO of Keycom is a full member of the International Electrotechnical Commission (IEC) for the development of standards|
|*||Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS).
→Elected for JIS standardization by committee members
-Measurement of electrical permittivity
-Measurement of rate of absorbance of radio waves
Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS).
→Methods for measuring the dielectric characteristics of fine ceramics in the millimeter-wave region
Part2:Open resonator method -JIS R 1660-2:2004-
→Noise Suppression Sheet for digital devices and equipment
Part2:Definitions and general Properties -IEC62333-1:2006-05-
→Methods for measuring the rate of absorption of radio waves for wave absorbers in the millimeter-wave region -JIS R 1679:2007-
→Measurement Methods for Reflectivity of Electromagnetic Wave Absorbers in Millimeter Wave Frequency -IEC62431-