Measurement service
| A. Electric material properties / characteristics electromagnetic wave / electrical characterization and measurement | B. Antenna, Radar | C. Circuit evaluation, board analysis, product / defect / failure analysis |
|---|---|---|
| 1. Dielectric constant (permittivity, εr') and dielecric loss tangent (tan δ) | 1. Antenna radiation, Antenna pattern profile, Gain | 1. Substrate analysis |
| 2. Reflection / absorption characteristics / radio wave absorption rate (wave absorber, anti-reflective material, stealth paint) of the radio control material (far field / near-field noise suppression sheet) | 2. Evaluation and measurement of millimeter-wave radar | |
| 3. Magnetic material (magnetic permeability, etc.) | 3. Measurement of the beam shift and the transmission attenuation by emblem or bumper | |
| 4. Transmission attenuation | 4. Simulation of RCS (Radar Cross Section) | |
| 5. Shield Effect | 5. Acquisition of image data and the RCS of the object | |
| 6. EPR(Electro spin resonance) mesurement | etc. | |
| 7. Transmission characteristics | ||
| 8. Migration | ||
| 9. Conductivity / electrical conductivity / volume resistivity measurement | ||
| 10. Transmission / reflection characteristic measuring (Impedance evaluation, Q value evaluation) | ||
| 11. Load Q-value (QL) measurement, material Q-value (Q0) is estimated | ||
| 12. Conductivity measurement, The surface resistance measurement | ||
| 13. Contact probing in the millimeter-wave band | ||
| 14. | ||
| 15. | ||
| The others |
| D. Simulation | E. Consulting etc. | |
|---|---|---|
| 1. Wave absorption rate (Single layer /Multiple layers) | 1. | |
2. Transmission attenuation, Reflection attenuation
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| 3. Antenna | ||
| 4. Transmission Line | ||
| 5. Filter | ||
Service Deliverly Date
- Usual delivery period: 1 week (negotiable if express delivery is required)
- Delivery at the end of the year or other busy periods: 2 weeks (negotiable if express delivery is required)
- Delivery in the case of time-consuming measurements: 2~3 weeks (negotiable if express delivery is required)
In the case of difficult / advanced measurement
KEYCOM will do its best to perform, by utilizing our experience developing various measurement devices. Please feel free to contact us for consultation (Note:the delivery period is longer than usual, at 3 weeks or more).
Example: Measurement method developed in November 2005→ measurement of the electric permittivity and the dielectric tangent for ultrathin films (0.01μm) with low-frequency waves.
Keycom's advanced technology backed by more than 25 years of experience
Member of IEC Committee
KEYCOM's CEO is a full member of the International Electrotechnical Commission (IEC) for the development of standards
Member of JIS Committee / KEYCOM's technology adopted as JIS standard
Measurement of electric/magnetic permittivities and wave absorption rate
Elected for JIS standardization by committee members
- Measurement of electrical permittivity
- Measurement of rate of absorbance of radio waves
Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS).
- Methods for measuring the dielectric characteristics of fine ceramics in the millimeter-wave region Part2:Open resonator method -JIS R 1660-2:2004-
- Noise Suppression Sheet for digital devices and equipment Part2:Definitions and general Properties -IEC62333-1:2006-05-
- Methods for measuring the rate of absorption of radio waves for wave absorbers in the millimeter-wave region -JIS R 1679:2007-
- Measurement Methods for Reflectivity of Electromagnetic Wave Absorbers in Millimeter Wave Frequency -IEC62431-
Part3:Measuring method-IEC62333-2:2006-05-