KEYCOM provides solutions in the 300 GHz to 1 μHz frequency range (SHF/EHF/MW/UHF/VHF/ULF).
We undertake designing, manufacturing and measuring. Please feel free to contact us.

KEYCOM Service Center for Quality Measurements, Evaluations and Analyses

Model No. ES

KEYCOM has not only developed measurement devices and systems based on its advanced technologies for products in the 10μHz~300GHz (VHF/UHF/Microwave/Millimeter wave) field, but has also refined its measurement technologies for a wide variety of materials over 25 years of providing measurement services.

In addition to our original measurement equipment, we also own a 110 GHz vector network analyzer, a 110 GHz scalar network analyzer, an 80 GHz spectrum analyzer, a 70 GHz oscilloscope, and various other measurement equipment.

This allows us to cover the measurement needs of most materials, including solids, sheets, films, powders, liquids, and multilayer structures.

Please feel free to contact us.

We will be happy to advise you from our professional point of view.

Measurement service

A. Electric material properties / characteristics electromagnetic wave / electrical characterization and measurement B. Antenna, Radar C. Circuit evaluation, board analysis, product / defect / failure analysis
1. Dielectric constant (permittivity, εr') and dielecric loss tangent (tan δ) 1. Antenna radiation, Antenna pattern profile, Gain 1. Substrate analysis
2. Reflection / absorption characteristics / radio wave absorption rate (wave absorber, anti-reflective material, stealth paint) of the radio control material (far field / near-field noise suppression sheet) 2. Evaluation and measurement of millimeter-wave radar  
3. Magnetic material (magnetic permeability, etc.) 3. Measurement of the beam shift and the transmission attenuation by emblem or bumper  
4. Transmission attenuation 4. Simulation of RCS (Radar Cross Section)  
5. Shield Effect 5. Acquisition of image data and the RCS of the object  
6. EPR(Electro spin resonance) mesurement etc.  
7. Transmission characteristics    
8. Migration    
9. Conductivity / electrical conductivity / volume resistivity measurement    
10. Transmission / reflection characteristic measuring (Impedance evaluation, Q value evaluation)    
11. Load Q-value (QL) measurement, material Q-value (Q0) is estimated    
12. Conductivity measurement, The surface resistance measurement    
13. Contact probing in the millimeter-wave band    
14.    
15.    
The others    

D. Simulation F. Consultant etc.
1. Molecular orbital calculation 1.
etc.    
     
     
     
     
     
     
     

Service Deliverly Date

In the case of difficult / advanced measurement

KEYCOM will do its best to perform, by utilizing our experience developing various measurement devices. Please feel free to contact us for consultation (Note:the delivery period is longer than usual, at 3 weeks or more).

Example: Measurement method developed in November 2005→ measurement of the electric permittivity and the dielectric tangent for ultrathin films (0.01μm) with low-frequency waves.

Keycom's advanced technology backed by more than 25 years of experience

Member of IEC Committee

KEYCOM's CEO is a full member of the International Electrotechnical Commission (IEC) for the development of standards

Member of JIS Committee / KEYCOM's technology adopted as JIS standard

Measurement of electric/magnetic permittivities and wave absorption rate

Elected for JIS standardization by committee members

Devices developed by Keycom for the measurement of the electric/magnetic permittivities and rates of absorption of radio waves have been standardized by the Japan Industrial Standards (JIS).