KEYCOM provides solutions in the 300 GHz to 1 μHz frequency range (SHF/EHF/MW/UHF/VHF/ULF).
We undertake designing, manufacturing and measuring. Please feel free to contact us.

Dielectric Constant(Permittivity, εr') , Dielectric Loss Tangent(tanδ), Permeability(μr') Measurement System

Model No. DPS
Higher repeat rate of customers and abundant delivery records,
backed up by more than 25 years of experience
1.　Extensive measurement experience and expertise in dielectric constant and magnetic permeability

Based on our more than 25 years of experience in providing measurement services and our knowledge gained from participating as a member of IEC (International Electrotechnical Commission) and JIS (Japanese Industrial Standards) to propose and standardize advanced measurement methods, we can accurately propose the most suitable measurement system.

We can fulfill needs of measuring almost all materials, including solids, sheets, films, powders, liquids, and multilayer structures.

2. High-precision and practical measurement equipment

Taking advantage of our extensive experience and knowledge, we can propose high performance measurement equipment to meet your needs.

Examples of specifications are as follows (please consult us for details).

・High accuracy of ±1%.　　
・Non-destructive　
・0.1μm ultra-thin film　
・ Measurement of solids, sheets, films, powders, liquids (including oil, etc.), multilayer structures, etc.
・Measurement range: 10μHz-140GHz (using multiple instruments)

3. Flexible and quick customization and consulting

Our measurement devices are manufactured in Japan.
Therefore, we can respond flexibly and promptly to your requests for customization and technical consultation.

In addition, we can develop equipment for flexible substrates, semiconductors, thin films, microwave/millimeter-wave substrates, microwave/millimeter-wave resonators, and liquids.

4. Support system

If you have any problems after purchase, please feel free to call us.
We will be happy to advise you based on our 28 years of experience in the business, to the best of our knowledge.

KEYCOM has not only electrical engineers, but also chemical engineers.
We are ready to meet the customers'needs of both chemical and electrical industry/section for measurement and analysis.

In addition, our financial base is as follows, and we have established a system that can support you for many years to come.Please feel free to contact us.

【Company Information】

How to select the measurement methods

Selecting Dielectric Constant Measurement Method

Select from specimens

  Title Ref. No. Frequency ex) Sample Feature
1. Open type Resonator method DPS03 18GHz~110GHz Multilayer material
Printed board
Film(Ultra thin film)
Powder
Sheet(Board)
Radome cover
Ceramics
Dielectric resonator
Ferroelectric
 Resonator method series
For low tan delta materials
High accuracy
Point frequency
2. TM-mode Perturbation method DPS18 200MHz~10GHz
3. TE-mode Cavity Resonator DPS19 10GHz~40GHz
4. Strip line type Resonance method DPS50 800MHz~14GHz
5. Micro strip line type Resonance method DPS01 800MHz~14GHz
6. Circular Disk type Resonator method DPS51 3GHz~70GHz
7. LC Resonator method DPS26 10MHz, 50MHz, 100MHz
8. Parallel conductor plate type
Dielectric resonator method		 DPS14 3GHz~26.5GHz
9. Frequency change method DPS10 2.6GHz~110GHz Multilayer material
Printed board
Powder
Board
Phantom
Wave absorber
Radome cover		 Frequency change method series
For low tan delta and thick materials
10. Frequency change method Coaxial tube and waveguide type DPS09 10MHz~60GHz
11. Probe type (open mode) DPS16 30MHz~90GHz Multilayer material
Sheet(Board)
Phantom material
Wave absorber
Noise suppression sheet
Soil
Concrete, Asphalt
Radome cover
Fruit, Vegetable
Liquid
 S parameter method series
For highr tan delta materials
Wide coverage of frequency
Permeability is measureable (12, 13. 14)
12. Probe type (short mode) DPS25 100kHz~10GHz
13. Coaxial Tube and Waveguide Type S-parameter method DPS08 12MHz~40GHz
14. Free space type S-parameter method DPS24 2.6GHz~110GHz
15. Propagation Delay Mode Cut Back Type
Coaxial Tube Method		 DPS05 45MHz~40GHz
16. Capacitance method DPS17 1Hz~1GHz Multilayer material
Printed board
Film(Ultra thin film)
Sheet(Board)
Phantom material
Noise suppression sheet
Liquid
Ceramics
Semiconductor
 Capacitance method series
For low frequency
High accuracy
Wide coverage of frequency
17. MOSFET structure semiconductor depletion layer
And just below the gate electrode dielectric film		 DPS48 20Hz~2MHz
18. Ellipsometry method DPS02 26.5~110GHz   Ellipsometry method
Dielectric cnstant,
permeability measurement

Select from measurement frequency, dielectric constant, dielectric loss tangent

Select from measurement frequency, dielectric constant, dielectric loss tangent

Select from measurement frequency, method, specimen size

Select from measurement frequency, method, specimen size

Select from specific request


The following table is based on FAQ. Please contact us for details.
When you want to measure an ultra thin film on the printed board with high accuracy
(measurement of film, multilayer material)		 » Perturbation method
When your sample is so thin it falls apart without supporting medium
(measurement of film, multilayer material)		 » Perturbation method
When high accuracy is the priority (εr' ±1% tanδ ±3%) » Perturbation method
When you only have a sample as small as 1mm » Probe method
When you want to measure it in high accuracy by super-high frequency.
(20GHz - 110GHz) 		» Resonance method
resonator open type
When you want to measure it by super-low frequency.(10μHz - 10Hz) » Capacitance method
When you want to measure liquid » Probe method
When you want to measure powder » Probe method
When you want to measure volatile substance such as gasoline » Probe method
When you want to change the measurement temperature » Capacitance method
When you want to sweep frequency and obtain rough result, accuracy is less importan (εr' ± 7% tanδ ± 10%) » S-parameter method
When you do not want your sample cut or reshaped (Non-destructive) » Resonance method
micro strip line type
When you want the process as simple as possible » Probe method
When you want to measure dielectric constant, dielectric loss tangent,and permeability at once » S-parameter method

Introduction to KEYCOM's measurement methods

1.  Resonance method

Hiroke Suzuki of Keycom articipated in the drafting of the standard as a member of the committee, and it was officially standardized in the spring of 2004.

1.1.  Open resonator method for sheet and ultra thin sheet dielectric constant and dielectric loss tangent(millimeterwave) measurement system [DPS03]
KEYCOM’s ultra-thin sheet measurement system employs the Fabry-Perot resonator, a liner optical resonator which consists of two highly reflecting mirrors, which combines the high measurement accuracy in the millimeter wave range and simplicity of installing the specimens.
It is also ideal for specimens with low tanδ.
This method was presented at 2005 IEEE Instrumentation and Measurement Technology Conference Ottawa Ontario, CANADA.

* High accuracy : εr' ± 3% , tan δ ± 7%
* Ultra-thin films with thicknesses of 10 - 100 μm measurable
* Simple to operation
* Measurement requency range: 18 GHz - 110 GHz

Detail!
1.2.  Resonance method strip line type for sheet dielectric constant and dielectric loss tangent measurement system [DPS50]
In frequency range from 800MHz to 14GHz, it is the measurement system of εr'and tanδ , for sheet material of small dielectric loss tangent and 1-40 εr'.
We follow the ASTMD3380-75 Standard method of Test for Permittivity(Dielectric Constant) and Dissipation Factor of Plastic-Based Microwave Circuit Substrates and IPC-L-125 Specification for Plastic Substrates, Clad or Unclad, for High Speed / High Frequency Interconnections.
Detail!
1.3.  Circular Disk Resonator Type Dielectric Constant and Dielectric Loss Tangent(Dk/Df) Measurement System [DPS51]
The system is for measuring εr' and tan δ of sheet materials with relatively small dielectric loss whose εr' is approximately 1.05 to 10 at frequencies from 3 GHz to 70 GHz.
KEYCOM made presentation about the measurement method at IEEE IMS in 2012.
[References]
Hirosuke Suzuki, Masato Inoue "Complex Permittivity Multi-Frequency Measurements for Dielectric Sheets Using a Circular Disk Resonator".
2012 IMS2012 THPB-1
Detail!
1.4.  Resonance method micro strip line type for sheet and ultra thin sheet dielectric constant and dielectric loss tangent measurement system [DPS01]
The system can measure εr and tanδ of materials with relatively small dielectric loss and ultra-thin sheet materials with εr approximately from 1 to 40 at frequencies from 800MHz to 14GHz, and also measure ultra-thin dielectric sheets.
It conforms to ASTMD3380 Standard method of Test for Permittivity (Dielectric Constant) and Dissipation Factor of Plastic-Based Microwave Circuit Substrates, and IPC-L-125 Specification for Plastic Substrates, Clad or unclad, for High Speed/High Frequency Interconnections.
Detail!

2.  Perturbation method

2.1.  Perturbation method specimen-hole closed type, cavity resonance mode, for ultra thin sheet dielectric constant and dielectric loss tangent measurement system [DPS18]
KEYCOM’s high precision perturbation method enables you to measure dielectric constant (permittivity, εr) and dielectric loss tangent (tan δ) of such specimens as multi-layered structure, ultra-thin film or ferroelectric materials in the microwave region.
KEYCOM refined the conventional perturbation method that was JIS-standardized in 1992 (JISC2565) by closing the hole into which the specimen is inserted with metal, and the new method is also compliant with ASTMD2520.
* High accuracy : εr' accuracy ±1%, tan δ accuracy ±3%.
* Capable of meeasuring Ultra-thin films (less than 0.1μm in thickness), multi-layer film
* Also ideal for solids, sheets, powders, liquids (oils, etc.)
* User-friendly operability.
* Measurement frequency range : 200 MHz - 10 GHz.
Detail!

3.  Propagation delay method

3.1.  Propagation delay mode cut back type coaxial tube method dielectric constant and dielectric loss tangent measurement system [DPS05]
In the 45 MHz-40 GHz frequency range, this system measures permittivity(dielectric constant, εr) and dielectric loss tangent(tan δ) of liquids having εr of approximate 1.05-500. It can also estimate the voltage dependence of εr and tan δ for samples such as liquid crystals by applying a bias voltage during the measurement.
Detail!
3.2.  Propagation delay mode Cut Back type Coplanar line method dielectric constant and dielectric loss tangent(Dk/Df) measurement system  [DPS07]

In the range of 500MHz-65GHz, this system measures dielectric constant and dielectric loss tangent of liquids.
The measuring is made to cover the coplanar with a liquid of 0.2mm(approx.) thick.
The system leads to measure of dielectric constant and dielectic loss tangent of the liquid from the effective tanδ and effective dielectric constant of the dielectric forming the liquid and the coplanar line with a built-in electro magnetic field simulation of the coplanar line.
It also evaluates voltage dependence of dielectric constant and dielectric loss tangent of liquid crystal and the like by impressing Bias.

It consist of the Cut Back method using a propagation line and the merits are as follows.
*Decrease of unclearly diverged loss compared to the Probing method.
*Improvement of characteristic impedance equality
*Simplification of measurement
*Improvement of accuracy
The test kit for the Cut Back is designed to obtain characteristic impedance of 50Ω when the liquid specimen dropped.

Detail!
3.3.  Propagation delay mode Cut Back type Stripline method dielectric constant and dielectric loss tangent measurement system(Dk/Df) [DPS15]

This system measures εr、and tanδof dielectric sheet and clayish specimens in the range of 500MHz - 40GHz.
In case of measuring powder-like specimens it is possible to measure by adding optional software tools to calculate permittivity and tanδ with the shade density and the true density of the powder specimens , temperature measurement equipment and temperature dependence calculation soft.
And it enables evaluation of the voltage dependence of εr tanδ　by impressing Bias.

It consists of the Cut Back method using propagation lines and has merits below.
Improvement of accuracy and simplification of measuring by correcting reflective loss caused by a mismatching of Characteristic Impedance.
Continuously variable frequency (frequency sweep).

The test kit for the Cut Back is designed to achieve 50Ωwhen the kit pinches specimens.
Detail!

4.  Probe method

4.1.  Open Mode Probe Method Dielectric Constant and Dielectric Loss Tangent Measurement System(Dk/Df) [DPS16]

KEYCOM offers probes with different outside diameters of 1.2mmφ, 2.2mmφ, 3.6mmφ to meet specific measurement requirements.
KEYCOM's distinduished open probe method along with the system supports up to 90GHz, whereas general probe methods only support up to 50GHz.

 


Features of KEYCOM Probe Method
- Wide frequency range, 200MHz up to 90GHz.
- Ideal for solid, liquid, and powdwer samples.
- Reference samples other than pure water are applicable (ex. acetone)
Detail!
4.2.  S-Parameter Method, Probe (Short) Type Relative Permittivity, Dielectric Loss Tangent (Dk/Df), Measurement System  [DPS25]
・Possible to measure from low frequency (100KHz) to high frequency (10GHz).
・Solids and liquids can be used as samples.
・The electric field is perpendicular to the sample surface, which is the same direction as that of microstrip lines and strip lines.
・The electric field is perpendicular to the sample surface, the same direction as the microstrip line and strip line.
Detail!

5.  S parameter method

5.1.  S-Parameter Method,Reflection and Transmission Mode,Coaxial Tube and Waveguide Type Dielectric Constant, Dielectric Loss Tangent, Permeability Measurement System [Permittivity, Dk/Df] [DPS08]
KEYCOM provides S-parameter method measurement systems in two modes, the reflection mode and the transmission mode, to address the individual purposes.Both modes measure the complex permittivity (εr) and complex permeability (μr) at the same time, and the proper usage is as follows.
The optional software DMP-70 calculates the absorption ratio and the reflection ratio of electromagnetic absorbers based on the complex εr and complex μr.
Detail!
5.2.  S-Parameter Method, Free Space Type Dielectric Constant, Dielectric Loss Tangent, Permeability (μ'/μ''), Transmission attenuation, Electric wave absorptance Millimeter wave / Microwave Measurement equipment [εr', tanδ / Dk, Df]  [DPS24]
Unlike the coaxial tube and waveguide types, the sample is not placed inside the fixture, so errors due to air gaps do not occur. It also provides practical data when there are uneven characteristics or unevenness depending on the location of the sample.
A lens is attached to the antenna, allowing the sample to be measured in a plane wave while remaining compact.The measurement is performed by connecting a vector network analyzer and a computer to the test fixture and observing the S-parameters S21 and S11.
Detail!

6.  Capacitance method

6.1.  Capacitance Method:Dielectric Constant and Dielectric Loss Tangent Measurement System(Dk/Df) for Flat Plate, Liquid, Gel, Ultra-Thin Film, Thin-film Compounds [DPS17]
KEYCOM’s capacitance method/system is ideal for dielectric constant and dielectric loss tangent measurement of flat plane, liquid, or gel and capable of taking measurements in the temperature range from liquid nitrogen or -70 to 400 degrees Celsius.
Different types of electrodes are available for specific states of specimens; DPT-009 for plate, thin film, gel, DPT-012, DPT-013-050 and DPT-013-200 for liquid, and DPT-2141 for ceramic insulators.
Detail!

7.  Incident Angle Changing Method

7.1.  Angle of Incidence Change Method Dielectoric Constant, Dielectric Loss Tangent, Permeability(Dk/Df) Measurement System [DPS22]
The incident angle dependence of the reflection attenuation and the reflection phase angle are measured for TE and TM waves.The complex relative permittivity and complex permeability are obtained by inverse estimation from these measurements.
Unlike the coaxial tube and waveguide types, the sample is not placed inside the fixture, so there is no air gap error.
Since a lens is attached to the antenna, the sample can be measured as a plane wave despite its compact size, and high measurement accuracy can be obtained.
Radio wave emitted from the antenna is a parallel beam, so the sample can be made smaller.In addition, εr' and μr can be obtained for each frequency.
*Measurements can be made without an anechoic chamber.
Detail!

8.  Transmission Attenuation Method

8.1.  Millimeter Wave, Permittivity, Dielectric Loss Tangent and Transmission Attenuation Measurement System [RTS02]

The relative dielectric constant and tan δ are obtained from the relationship between the frequency and the transmission attenuation when millimeter waves pass through a flat plate.
*Measured values are averaged values in the measurement frequency band. There is no problem in practical use.
A lens is attached to the antenna, and although it is compact, the sample can be measured with plane waves, and high measurement accuracy can be obtained.
The sample can be set near the antenna, making the sample smaller.
It is also possible to measure the reflection attenuation of radio wave absorbing materials using optional software.　

Measurement frequency range 26.5~110GHz
Sample size 100mm × 100mm or more, 300mm × 300mm or less

👉Note: The higher the frequency, the smaller the sample can be measured. Using a standard vector network analyzer and applying GATE beyond the lens after calibration, transmission attenuation can be measured with a resolution of 0.1 dB and dielectric constant of 0.01.Scalar network analyzers and synthesized sweepers can also be used.
Detail!
8.2.  Microwave, Permittivity, Dielectric Loss Tangent and Transmission Attenuation Measurement System [RTS04]

The relative dielectric constant and tan δ are obtained from the relationship between the frequency and the transmission attenuation when millimeter waves pass through a flat plate.
*Measured values are averaged values in the measurement frequency band. There is no problem in practical use.
A lens is attached to the antenna, and although it is compact, the sample can be measured with plane waves, and high measurement accuracy can be obtained.
The sample can be set near the antenna, making the sample smaller.
It is also possible to measure the reflection attenuation of radio wave absorbing materials using optional software.　

Measurement frequency range 5.0~26.5GHz
Sample size 300mm × 300mm or more

👉Note: The higher the frequency, the smaller the sample can be measured. Using a standard vector network analyzer and applying GATE beyond the lens after calibration, transmission attenuation can be measured with a resolution of 0.1 dB and dielectric constant of 0.01.Scalar network analyzers and synthesized sweepers can also be used.
Detail!
8.3.  Microwave, Vertical Type Permittivity (Dielectric constant), Dielectric Loss Tangent and Transmission Attenuation Measurement System [RTS03]

The measurement frequency range of this system is from 26.5 GHz to 110 GHz.
The relative dielectric constant and tan δ are obtained from the relationship between the frequency and transmission attenuation when millimeter waves pass through a flat plate.
Unlike the coaxial tube or waveguide type, the sample is not placed inside the fixture, so there is no air gap error.
In addition, the antenna is equipped with a lens, which allows the sample to be measured in plane wave mode despite its compact size.
*1. Measured values are averaged values in the measurement frequency band. There is no problem in practical use.
*2. This system cannot calculate the reflection attenuation of radio wave absorbing materials. If you want to measure it, please refer to [RTS02] above.

Detail!

9.  Other measurement methods

9.1.  Parallel Conductor Plate Type, Dielectric Resonator Method, Dielectric Constant and Dielectric Loss Tangent Measurement System(Dk/Df) [DPS14]
This is a high-precision measurement system for microwave band εr and tanδ, mainly for low-loss materials. A cylindrical sample is used. The measurement method is specified in JIS R 1627.
Detail!
9.2.  Ellipsometry Method, Dielectric Constant and Permeability Measurement System(Dk/Df) [DPS02]
Because of scalar measurement, the system does not require an expensive vector network analyzer.
By measuring the amplitude ratio and phase difference between the TE and TM waves of the reflection coefficient, the complex relative permittivity and complex permeability can be determined.
Unlike the coaxial tube and waveguide types, the sample is not placed inside the fixture, so errors due to air gaps do not occur.
A lens is attached to the antenna, making it compact and allowing the sample to be measured in a plane wave. In addition, the sample can be set near the antenna, making the sample smaller. In addition, εr and μr can be obtained for each frequency.
Detail!
9.3.  Cutoff Cylinder Waveguide For Millimeter-wave measurement of Relative Permittivity and Dielectric Loss Tangent (εr', tanδ)  [DPS20]
The cutoff cylindrical waveguide is used for measuring εr and tanδ for low-loss dielectric substrates, mainly in millimeter-wave circuits.
Detail!
9.4.  Capacitance Measurement System (10kHz～110GHz)  [CAP01]
The cutoff cylindrical waveguide is used for measuring εr and tanδ for low-loss dielectric substrates, mainly in millimeter-wave circuits.
Detail!